OEE Dashboards
Program: Applied Computing Bachelor's Completion
Host Company: 3M
Location: Prairie du Chien, Wisconsin (onsite)
Student: James D Haefer
The OEE (Overall Equipment Effectiveness) dashboard capstone project focuses on monitoring and improving the performance of manufacturing lines. The dashboard consolidates key production metrics—Availability, Performance, and Quality—into a unified view, allowing real-time visualization of equipment effectiveness. Data is collected from factory equipment through sensors or PLCs and is stored in a time-series database such as Historians, SQL databases, and other data sources. Grafana is then used to create dynamic dashboards that display OEE trends, downtime analysis, cycle times, and defect rates.
This capstone highlights the practical use of Grafana and SQL queries in an industrial setting, helping operators and managers quickly identify bottlenecks, unplanned downtime, and quality issues. By visualizing historical and live data, the dashboard supports data-driven decision-making and continuous improvement efforts on the production floor. Key features include drill-down capabilities by line, shift, or equipment, and customizable alerts for performance drops.